发明申请
- 专利标题: Method and apparatus for eliminating and compensating thermal transients in gas analyzer
- 专利标题(中): 消除和补偿气体分析仪热瞬变的方法和装置
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申请号: US10863810申请日: 2004-06-08
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公开(公告)号: US20050268690A1公开(公告)日: 2005-12-08
- 发明人: Kurt Weckstrom , Heikki Haveri , Mika Hietala
- 申请人: Kurt Weckstrom , Heikki Haveri , Mika Hietala
- 主分类号: G01N21/27
- IPC分类号: G01N21/27 ; G01N21/35 ; G01N21/61 ; G01N7/00
摘要:
The invention concerns a gas analyzer comprising: a measuring volume (2), a radiation source (1) for providing a beam to pass said measuring volume; a heat sink (16) for said radiation source; at least one thermal detector (3) having a hot junction within a support structure and receiving the radiation and a cold junction for reference within the same support structure and protected from said radiation; at least one optical bandpass filter (9) between said hot junction and said radiation source; and a thermal mass (11), which is formed of a material having high thermal conductance. The thermal mass has a cavity with a bottom step (34) and a rim (32), and a first length therebetween. The support structure has a frontal edge (35) and a base plate lip (33), and a second length therebetween. There is a radial gap between the thermal mass and the support structure. Press means urge said support structure in the cavity, whereupon a more efficient thermal contact is either between said frontal edge and said bottom step, or between said base plate lip and said rim. A first thermal barrier (17) is between the heat sink and the thermal mass, and a second thermal barrier (22) surrounds the thermal mass. A shield (19) formed of a material having high thermal conductance covers said second thermal barrier and is in thermal contact with said heat sink.
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