发明申请
US20050270833A1 Reading circuit for reading a memory cell 有权
用于读取存储单元的读取电路

Reading circuit for reading a memory cell
摘要:
A reading circuit comprises a first and second cascode circuit and a first and second current mirror. The first cascode circuit can connected to a bit line of a memory cell and the second cascode circuit can be connected to a reference bit line of a reference cell. The first output terminals of the first and second cascode circuits are connected to first terminals of the first and second current mirrors, respectively. The second output terminals of the first and second cascode circuits are connected to the second terminals of the second and first current mirrors, respectively. A tri-state buffer is coupled between the second terminals of the first and second current mirrors said buffer having bit invert capabilities.
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