发明申请
- 专利标题: Method and kits to detect beryllium by fluorescence
- 专利标题(中): 通过荧光检测铍的方法和试剂盒
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申请号: US11152620申请日: 2005-06-14
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公开(公告)号: US20050280816A1公开(公告)日: 2005-12-22
- 发明人: Anoop Agrawal , John Cronin , Alan Goodyear , Juan Tonazzi
- 申请人: Anoop Agrawal , John Cronin , Alan Goodyear , Juan Tonazzi
- 主分类号: G01J3/30
- IPC分类号: G01J3/30 ; G01N21/64 ; G01N21/77 ; G01N21/94 ; G01N23/223 ; G01T1/36
摘要:
A low-cost practical method of determining beryllium or a beryllium compound thereof in a sample is disclosed by measuring fluorescence. This method discloses optical filters for use with low cost fluorometers which may be used to quantitatively determine the presence of beryllium. This method may be extended to estimate particle size distribution for particles comprising Beryllium. A method is also disclosed to store solutions for extended period of time so that these materials are stable during transportation and in the labs.
公开/授权文献
- US08945931B2 Method and kits to detect beryllium by fluorescence 公开/授权日:2015-02-03