发明申请
- 专利标题: Impact test apparatus and impact test method
- 专利标题(中): 冲击试验装置及冲击试验方法
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申请号: US11143502申请日: 2005-06-03
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公开(公告)号: US20060005606A1公开(公告)日: 2006-01-12
- 发明人: Takezou Hatanaka , Yasunori Sugihara , Junji Yoshida , Yukiko Azumi , Yuuki Kagehisa
- 申请人: Takezou Hatanaka , Yasunori Sugihara , Junji Yoshida , Yukiko Azumi , Yuuki Kagehisa
- 申请人地址: JP Ibaraki-shi 567-8680
- 专利权人: NITTO DENKO CORPORATION
- 当前专利权人: NITTO DENKO CORPORATION
- 当前专利权人地址: JP Ibaraki-shi 567-8680
- 优先权: JP2004-202435 20040708; JP2005-072186 20050315
- 主分类号: G01N33/00
- IPC分类号: G01N33/00
摘要:
An impact test apparatus includes a holding device for holding a test piece at an arbitrary holding force, an impact applying device for applying an impact force to the test piece held by the holding device, a force sensor for sensing the impact force applied to the test piece by the impact applying device, a high-speed camera for detecting a displacement of the test piece when applied with the impact force by the impact applying device, and an output device for synchronizing a signal from the force sensor with a signal from the high-speed camera and outputting an impact stress-strain characteristic curve when the impact force is applied to the test piece.
公开/授权文献
- US07222515B2 Impact test apparatus and impact test method 公开/授权日:2007-05-29