- 专利标题: Torsional harmonic cantilevers for detection of high frequency force components in atomic force microscopy
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申请号: US10887608申请日: 2004-07-08
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公开(公告)号: US20060005614A1公开(公告)日: 2006-01-12
- 发明人: Ozgur Sahin , Calvin Quate , Olav Solgaard
- 申请人: Ozgur Sahin , Calvin Quate , Olav Solgaard
- 专利权人: Board of Trustees of the Leland Stanford,Junior University
- 当前专利权人: Board of Trustees of the Leland Stanford,Junior University
- 主分类号: G12B21/08
- IPC分类号: G12B21/08 ; G01L1/10 ; G01N13/16
摘要:
A cantilever for the use in atomic force microscopy includes a cantilever arm having a fixed end being attached to a base member and a free end where the cantilever arm has a first shape and an axis of torsion associated with the first shape, and a probe tip projecting from the cantilever arm near the free end where the probe tip is positioned in an offset displacement from the axis of torsion. Alternately, the cantilever arm has a first shape selected to tune a torsional resonance frequency of a selected torsional mode or the fundamental flexural resonance frequency of the fundamental mode so that the torsional resonance frequency and the fundamental flexural resonance frequency has an integer ratio. In this manner, the torsional motion of the torsional harmonic cantilever at that harmonic frequency will be largely enhanced by the corresponding torsional resonance.
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