发明申请
- 专利标题: Process for manufacturing an SOI wafer by annealing and oxidation of buried channels
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申请号: US10327702申请日: 2002-12-20
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公开(公告)号: US20060017131A9公开(公告)日: 2006-01-26
- 发明人: Flavio Villa , Gabriele Barlocchi , Pietro Corona
- 申请人: Flavio Villa , Gabriele Barlocchi , Pietro Corona
- 专利权人: STMicroelectronics S.r.I.
- 当前专利权人: STMicroelectronics S.r.I.
- 优先权: EP01830820.5 20011228
- 主分类号: H01L29/00
- IPC分类号: H01L29/00
摘要:
A process for manufacturing an SOI wafer, including the steps of: forming, in a wafer of semiconductor material, cavities delimiting structures of semiconductor material; thinning out the structures through a thermal process; and completely oxidizing the structures.