Invention Application
- Patent Title: Probe tip plating
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Application No.: US11196194Application Date: 2005-08-03
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Publication No.: US20060027747A1Publication Date: 2006-02-09
- Inventor: Bahadir Tunaboylu , Edward Malantonio , David Beatson , Andrew Hmiel
- Applicant: Bahadir Tunaboylu , Edward Malantonio , David Beatson , Andrew Hmiel
- Applicant Address: US DE Wilmington
- Assignee: K&S Interconnect, Inc.
- Current Assignee: K&S Interconnect, Inc.
- Current Assignee Address: US DE Wilmington
- Main IPC: C25D5/02
- IPC: C25D5/02 ; C25D17/00 ; H01J40/00
Abstract:
A method of processing a probe element includes (a) providing a probe element comprising a first conductive material, and (b) coating only a tip portion of the probe element with a second conductive material.
Public/Granted literature
- US07638028B2 Probe tip plating Public/Granted day:2009-12-29
Information query
