发明申请
US20060043276A1 Probe for near-field microscope, the method for manufacturing the probe and scanning probe microscope using the probe
有权
用于近场显微镜的探头，使用探头制造探头和扫描探针显微镜的方法
- 专利标题： Probe for near-field microscope, the method for manufacturing the probe and scanning probe microscope using the probe
- 专利标题（中）： 用于近场显微镜的探头，使用探头制造探头和扫描探针显微镜的方法
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申请号： US11196104申请日： 2005-08-03
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公开(公告)号： US20060043276A1公开(公告)日： 2006-03-02
- 发明人: Yuika Saito , Takashi Nurakami , Satoshi Kawata , Yasushi Inoue , Kazuhito Tsukagoshi , Masato Iyoki
- 申请人： Yuika Saito , Takashi Nurakami , Satoshi Kawata , Yasushi Inoue , Kazuhito Tsukagoshi , Masato Iyoki
- 优先权： JP2004-255133 20040902
- 主分类号： H01J3/14
- IPC分类号： H01J3/14
摘要：
In a manufacture of a probe for a scattering type near-field microscope, there is provided a method of coating, with a high reproducibility, uniform metal particles efficiently inducing a surface enhanced Raman scattering. It has been adapted such that, in the probe for the scattering type near-field microscope, one part or all of the probe due to an interaction of at least an evanescent field is coated by metal particles which don't mutually adhere and have a particle diameter of 10 nm or larger and 50 nm or smaller in radius of curvature.
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