Invention Application
- Patent Title: Ion trap mass spectrometer with scanning delay ion extraction
- Patent Title (中): 离子阱质谱仪,具有扫描延迟离子提取
-
Application No.: US10927874Application Date: 2004-08-27
-
Publication No.: US20060043282A1Publication Date: 2006-03-02
- Inventor: August Hidalgo , Stuart Hansen , Gangqiang Li
- Applicant: August Hidalgo , Stuart Hansen , Gangqiang Li
- Main IPC: H01J49/00
- IPC: H01J49/00

Abstract:
An apparatus for analyzing ions is described. The apparatus includes an ion source, an ion trap positioned to receive ions from the ion source; a time of flight mass analyzer, and a detector operatively coupled to the time of flight. The time of flight mass analyzer includes a pulser region, and the pulser region is positioned to receive ions from the ion trap. The apparatus further includes a scanning delay timing circuit in operable relation to the pulser region. The scanning delay timing circuit is adapted to triggering an extraction pulse at the pulser region. Methods of analyzing ions by mass spectrometry are also described.
Public/Granted literature
- US07208726B2 Ion trap mass spectrometer with scanning delay ion extraction Public/Granted day:2007-04-24
Information query