发明申请
- 专利标题: Part measurement prioritization system and method
- 专利标题(中): 零件测量优先系统和方法
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申请号: US11203819申请日: 2005-08-15
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公开(公告)号: US20060047457A1公开(公告)日: 2006-03-02
- 发明人: John Agapiou , Robert Aas , Pulak Bandyopadhyay
- 申请人: John Agapiou , Robert Aas , Pulak Bandyopadhyay
- 主分类号: G06F19/00
- IPC分类号: G06F19/00
摘要:
A system, method, and apparatus are provided for prioritizing the measurements made on manufactured parts while maintaining specified part quality standards. According to the method, system and apparatus, the process used by the CMM is modified so that the number of measurements made is reduced in accordance with the results of the analysis provided herein. A CMM apparatus is modified in accordance with the analysis results. A method for part measurement prioritization in a measuring system and method includes describing a set of features to be measured on a plurality of substantially identical parts, separating the set of features into sensitive features and non-sensitive features, dividing the non-sensitive features into a plurality of groups, and prioritizing the part measurements to measure the sensitive features and provide alternating measurements of the non-sensitive features.
公开/授权文献
- US07398179B2 Part measurement prioritization system and method 公开/授权日:2008-07-08
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