• 专利标题: Metal-insulator-metal capacitor and method for manufacturing the same
  • 申请号: US11265574
    申请日: 2005-11-02
  • 公开(公告)号: US20060054995A1
    公开(公告)日: 2006-03-16
  • 发明人: Sang-Hoon Park
  • 申请人: Sang-Hoon Park
  • 优先权: KR2003-14675 20030310
  • 主分类号: H01L29/00
  • IPC分类号: H01L29/00 H01L29/94
Metal-insulator-metal capacitor and method for manufacturing the same
摘要:
A capacitor has a lower electrode formed on an insulation layer, a dielectric layer formed on the lower electrode, an upper electrode layer formed on the dielectric layer, and a first protection layer pattern formed on the upper electrode layer. The upper electrode layer is etched using the first protection layer pattern to form an upper electrode. A second protection layer is formed enclosing the dielectric layer, the upper electrode and the first protection layer pattern.
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