发明申请
- 专利标题: Method for fabricating microstructure and microstructure
- 专利标题(中): 微结构和微结构的制作方法
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申请号: US11256959申请日: 2005-10-25
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公开(公告)号: US20060057761A1公开(公告)日: 2006-03-16
- 发明人: Xiaoyu Mi , Norinao Kouma , Osamu Tsuboi , Masafumi Iwaki , Hisao Okuda , Hiromitsu Soneda , Satoshi Ueda , Ippei Sawaki
- 申请人: Xiaoyu Mi , Norinao Kouma , Osamu Tsuboi , Masafumi Iwaki , Hisao Okuda , Hiromitsu Soneda , Satoshi Ueda , Ippei Sawaki
- 申请人地址: JP Kawasaki
- 专利权人: Fujitsu Limited
- 当前专利权人: Fujitsu Limited
- 当前专利权人地址: JP Kawasaki
- 主分类号: H01L21/00
- IPC分类号: H01L21/00
摘要:
A method of making a microstructure with thin wall portions (T1-T3) includes a step of performing a first etching process to a material substrate having a laminate structure including a first conductive layer (11) and a second conductive layer (12) having a thickness of the thin wall portions (T1-T3), where the etching is performed from the side of the first conductive layer (11) thereby forming in the second conductive layer (12) pre thin wall portions (T1′-T3′) which has a pair of side surfaces apart from each other in an in-plane direction of the second conductive layer (12) and contact the first conductive layer (11). The method also includes a step of performing a second etching process from the side of the first conductive layer (11) for removing part of the first conductive layer (11) contacting the pre thin wall portions (T1′-T3′) to form the thin wall portions.
公开/授权文献
- US07833430B2 Method for fabricating microstructure and microstructure 公开/授权日:2010-11-16
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