发明申请
US20060060789A1 Focusing system and method for a charged particle imaging system 有权
一种带电粒子成像系统的聚焦系统和方法

  • 专利标题: Focusing system and method for a charged particle imaging system
  • 专利标题(中): 一种带电粒子成像系统的聚焦系统和方法
  • 申请号: US11211355
    申请日: 2005-08-24
  • 公开(公告)号: US20060060789A1
    公开(公告)日: 2006-03-23
  • 发明人: Steven Rogers
  • 申请人: Steven Rogers
  • 主分类号: H01J1/50
  • IPC分类号: H01J1/50
Focusing system and method for a charged particle imaging system
摘要:
Apparatus for focusing a charged particle beam onto a surface, including a charged particle beam generator which is adapted to project the charged particle beam onto a location on the surface, thereby causing charges to be emitted from the location. The apparatus further includes an imaging detector which is adapted to receive the charges so as to form an image of the location, and an aberrating element which is positioned before the imaging detector and which is adapted to produce an aberration in the image. A processor is adapted to receive the image and to adjust at least one of the charged particle beam generator and a position of the surface in response to the aberration.
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