- 专利标题： Method and apparatus for measuring a digital device
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申请号： US10955627申请日： 2004-09-30
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公开(公告)号： US20060066289A1公开(公告)日： 2006-03-30
- 发明人: Hassan Tanbakuchi
- 申请人： Hassan Tanbakuchi
- 主分类号： G01R23/00
- IPC分类号： G01R23/00
摘要：
A method and apparatus for characterizing a non-linear device stimulates the device with a repetitive digital signal and uses relative phase measurements made with a vector network analyzer to measure the device response to the digital stimulus.
公开/授权文献
- US07088109B2 Method and apparatus for measuring a digital device 公开/授权日：2006-08-08
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