发明申请
- 专利标题: Silicon-on-insulator substrate, fabricating method thereof, and method for fabricating floating structure using the same
- 专利标题(中): 绝缘体上硅衬底及其制造方法以及使用其制造浮动结构的方法
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申请号: US11242824申请日: 2005-10-05
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公开(公告)号: US20060081929A1公开(公告)日: 2006-04-20
- 发明人: Seok-whan Chung , Hyung Choi
- 申请人: Seok-whan Chung , Hyung Choi
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 优先权: KR2004-83855 20041020
- 主分类号: H01L21/84
- IPC分类号: H01L21/84 ; H01L27/12
摘要:
A silicon-on-insulator (SOI) substrate including laminated layers of a substrate, an oxide layer, and a silicon layer in order. The oxide layer has an electrifying hole fluidly connected with the substrate and the electrifying hole is filled with a part of the silicon layer. A method for fabricating the floating structure is also disclosed which includes the steps of forming an oxide layer having a predetermined thickness on a substrate, forming one or more electrifying holes in an area of the oxide layer corresponding to an inner part of the floating structure, forming a silicon layer on the oxide layer including an electrification structure electrically connecting the silicon layer to the substrate, forming a pattern for the floating structure on the silicon layer, removing the oxide layer corresponding to an inner area of the pattern, forming a thermal oxide layer on a surface of the silicon layer, and removing the thermal oxide layer to form the floating structure.
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