A test board for a semiconductor device tester having a modified input/output printed circuit pattern and a testing method using the same are provided. In an embodiment, a modified input/output printed circuit pattern is formed and controlled by a test program, wherein the modified input/output printed circuit pattern is divided into a drive terminal and a comparator terminal, one of the terminals being connected to one input pin of a device under test (DUT) and the other being connected to an output pin of the DUT, unlike a typical input/output printed circuit pattern of the test board that is formed to be connected to one output pin of a DUT. Thus, it is possible to increase the number of devices under parallel test and to test semiconductor memory devices having larger capacity by using limited resources of the tester.