发明申请
US20060086810A1 RFID tags calibrating backscattering period also for non-integer divide ratios
有权
RFID标签校准后向散射周期也用于非整数分频比
- 专利标题: RFID tags calibrating backscattering period also for non-integer divide ratios
- 专利标题(中): RFID标签校准后向散射周期也用于非整数分频比
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申请号: US11258521申请日: 2005-10-24
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公开(公告)号: US20060086810A1公开(公告)日: 2006-04-27
- 发明人: Christopher Diorio , Todd Humes , Scott Cooper
- 申请人: Christopher Diorio , Todd Humes , Scott Cooper
- 申请人地址: US WA Seattle
- 专利权人: IMPINJ, Inc.
- 当前专利权人: IMPINJ, Inc.
- 当前专利权人地址: US WA Seattle
- 主分类号: G06K19/06
- IPC分类号: G06K19/06
摘要:
An RFID tag that receives a calibration instruction from a reader can determine the basic backscatter period of the symbols to be backscattered. According to some embodiments, when the instruction includes a calibration feature that is to be divided by a divide ratio, the tag measures the duration of the feature in terms of numbers of internal pulses, resulting in a binary L-number. Then at least two versions of the L-number (PR1-number, PR2-number) are combined, so as to yield the effective result of the division alternately, even when the divide ratio is a non-integer. The backscatter period can then be determined from the BP-number and the period of the internal pulses.
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