发明申请
US20060088118A1 METHOD OF COMPUTING PATH METRICS IN A HIGH-SPEED VITERBI DETECTOR AND RELATED APPARATUS THEREOF 有权
在高速VITERBI检测器中计算路径度量的方法及其相关设备

  • 专利标题: METHOD OF COMPUTING PATH METRICS IN A HIGH-SPEED VITERBI DETECTOR AND RELATED APPARATUS THEREOF
  • 专利标题(中): 在高速VITERBI检测器中计算路径度量的方法及其相关设备
  • 申请号: US11161202
    申请日: 2005-07-26
  • 公开(公告)号: US20060088118A1
    公开(公告)日: 2006-04-27
  • 发明人: Wen-Yi WuMeng-Ta YangPi-Hai Liu
  • 申请人: Wen-Yi WuMeng-Ta YangPi-Hai Liu
  • 优先权: TW093132017 20041021
  • 主分类号: H04L23/02
  • IPC分类号: H04L23/02 H04L5/12
METHOD OF COMPUTING PATH METRICS IN A HIGH-SPEED VITERBI DETECTOR AND RELATED APPARATUS THEREOF
摘要:
A path metric computing method applied in a high-speed Viterbi detector and related apparatus thereof are disclosed. The path metric computing apparatus includes a comparator for generating a control signal according a plurality of previous path metrics, a combining circuit for generating a plurality of first output values according to the previous path metrics and branch costs of a plurality of branches of a current state, and a multiplexer, electrically connected to the comparator and the combining circuit, for determining a first path metric of the current state according to the control signal and the output values.
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