Invention Application
- Patent Title: METHOD FOR REMOVING POLYMER AS ETCHING RESIDUE
- Patent Title (中): 用于去除聚合物作为蚀刻残留物的方法
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Application No.: US10904149Application Date: 2004-10-26
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Publication No.: US20060089003A1Publication Date: 2006-04-27
- Inventor: Yi-Fang Cheng , Shan-Jen Yu , Cheng-Kweng Chen , Yu-Ming Huang
- Applicant: Yi-Fang Cheng , Shan-Jen Yu , Cheng-Kweng Chen , Yu-Ming Huang
- Main IPC: H01L21/44
- IPC: H01L21/44

Abstract:
A method for removing polymer as an etching residue is described. A substrate with polymer as an etching residue thereon is provided, and a hydrogen-containing plasma is used to treat the substrate. A wet clean step is then performed to remove the polymer from the substrate. The treatment using hydrogen-containing plasma can change the chemical property of the polymer, so that the polymer can be removed more easily in the subsequent wet clean step.
Public/Granted literature
- US07199059B2 Method for removing polymer as etching residue Public/Granted day:2007-04-03
Information query
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