发明申请
- 专利标题: High light efficiency of GaN-series of light emitting diode and its manufacturing method thereof
- 专利标题(中): GaN系列发光二极管的高光效及其制造方法
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申请号: US11311275申请日: 2005-12-20
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公开(公告)号: US20060097272A1公开(公告)日: 2006-05-11
- 发明人: Mu-Jen Lai , Schang-Jing Hon
- 申请人: Mu-Jen Lai , Schang-Jing Hon
- 优先权: TW092132987 20031125
- 主分类号: H01L33/00
- IPC分类号: H01L33/00
摘要:
A high light efficiency of GaN-series of light emitting diode and its manufacturing method thereof disclose a process and structure of a p-type semiconductor layer of surface texture structure generation. The optical waveguide effect can be interrupted and the possibility of hexagonal shaped pits defect generated can be reduced through said texture structure. The method explores that controlling the tension and compression of strain while a p-type cladding layer and a p-type transition layer are generated, and then a p-type ohmic contact is formed on said p-type transition layer. Through the control and its structure of said epitaxial growth process, the surface of said p-type semiconductor layer is with texture structure to increase external quantum efficiency and its operation life.
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