发明申请
- 专利标题: Apparatus and method for inspecting a display
- 专利标题(中): 用于检查显示器的装置和方法
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申请号: US11283703申请日: 2005-11-22
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公开(公告)号: US20060114525A1公开(公告)日: 2006-06-01
- 发明人: Ho-joon Yoo , Min-kyu Park , Hee-seob Ryu , Sei-bum Ban , Soo-hyun Bae , Myung-hyun Yoo , Tae-hun Lee , Ji-hye Chung
- 申请人: Ho-joon Yoo , Min-kyu Park , Hee-seob Ryu , Sei-bum Ban , Soo-hyun Bae , Myung-hyun Yoo , Tae-hun Lee , Ji-hye Chung
- 申请人地址: KR Suwon-si
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址: KR Suwon-si
- 优先权: KR10-2004-0099947 20041201
- 主分类号: H04N1/46
- IPC分类号: H04N1/46
摘要:
An apparatus and method for inspecting a display. The apparatus includes a focus matching unit and an image control unit. A reference display receives a signal of a sample image during a first output period and displays a reference image according to the received signal. A target display receives the signal of the sample image during a second output period that does not overlap with the first output period and displays a test image according to the received signal. The focus matching unit may match display positions and sizes of the reference image and the test image. The image control unit may control the signal of the sample image stored in a predetermined memory to be output to the reference display during the first output period and controls the signal of the sample image to be output to the target display during the second output period.
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