发明申请
- 专利标题: Method and system for testing a display panel assembly
- 专利标题(中): 用于测试显示面板组件的方法和系统
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申请号: US11272479申请日: 2005-11-10
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公开(公告)号: US20060120588A1公开(公告)日: 2006-06-08
- 发明人: Sang-Hyuk Kwon , Kyoung-Ho Yang , Soon-Jae Park
- 申请人: Sang-Hyuk Kwon , Kyoung-Ho Yang , Soon-Jae Park
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 优先权: KR2004-91809 20041111
- 主分类号: G06K9/00
- IPC分类号: G06K9/00
摘要:
A test system includes a rotatable turntable, a loading section, a first image pickup section, a second image pickup section, a system control section and an unloading section. The loading section loads a display panel assembly onto the stage. The loading section recognizes a unique number of the display panel assembly. The first image pickup section obtains an active area image data from an active area image. A valid first active area defect is detected using an active area image data obtained from an active area image displayed on the display panel assembly. An inactive area defect is detected based on an inactive area image data and a reference inactive area image data.
公开/授权文献
- US07860296B2 Method and system for testing a display panel assembly 公开/授权日:2010-12-28
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