- 专利标题: Particle-removing apparatus for a semiconductor device manufacturing apparatus and method of removing particles
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申请号: US11354506申请日: 2006-02-15
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公开(公告)号: US20060131272A1公开(公告)日: 2006-06-22
- 发明人: Natsuko Ito , Fumihiko Uesugi , Tsuyoshi Moriya
- 申请人: Natsuko Ito , Fumihiko Uesugi , Tsuyoshi Moriya
- 优先权: JP101090/1998 19980413
- 主分类号: C23F1/00
- IPC分类号: C23F1/00
摘要:
In a semiconductor device manufacturing apparatus that processing a substrate by applying a voltage to a gas to create a plasma, positively charged particles are trapped or guided at the instant that the cathode voltage is stopped, by an electrode to which is imparted a negative voltage, so as to prevent particles reaching the substrate.
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