- 专利标题: Offset amount measuring method and apparatus
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申请号: US11301245申请日: 2005-12-13
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公开(公告)号: US20060133244A1公开(公告)日: 2006-06-22
- 发明人: Takao Tagiri , Seiro Oshima
- 申请人: Takao Tagiri , Seiro Oshima
- 申请人地址: JP Tokyo
- 专利权人: PIONEER CORPORATION
- 当前专利权人: PIONEER CORPORATION
- 当前专利权人地址: JP Tokyo
- 优先权: JP2004-366888 20041217
- 主分类号: G11B7/00
- IPC分类号: G11B7/00
摘要:
An offset amount measuring method is provided with: a recording process for measurement (i) of recording information for measurement, into a recording track in the L0 layer, by a predetermined section, from a measurement reference position, and of (ii) recording the information for measurement, into a recording track in the L1 layer, by the predetermined section, from or toward a measurement correspondence position, which is associated with the measurement reference position by the pre-format address; a first detecting process of detecting a border of a first recorded area in which the information for measurement is recorded and a first unrecorded area in the first recording track, on the basis of a difference in reflectance between the first recorded area and the first unrecorded area; a second detecting process of detecting a second border position in the recording track in the L1 layer, on the basis of a difference in reflectance; and a determining process of determining the offset amount, on the basis of the detected first and second border positions. Moreover, it is also provided with a judging process of judging whether or not the determined offset amount is within tolerance with respect to the first offset amount set in advance for offset countermeasures.
公开/授权文献
- US07548499B2 Offset amount measuring method and apparatus 公开/授权日:2009-06-16
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