Offset amount measuring method and apparatus
摘要:
An offset amount measuring method is provided with: a recording process for measurement (i) of recording information for measurement, into a recording track in the L0 layer, by a predetermined section, from a measurement reference position, and of (ii) recording the information for measurement, into a recording track in the L1 layer, by the predetermined section, from or toward a measurement correspondence position, which is associated with the measurement reference position by the pre-format address; a first detecting process of detecting a border of a first recorded area in which the information for measurement is recorded and a first unrecorded area in the first recording track, on the basis of a difference in reflectance between the first recorded area and the first unrecorded area; a second detecting process of detecting a second border position in the recording track in the L1 layer, on the basis of a difference in reflectance; and a determining process of determining the offset amount, on the basis of the detected first and second border positions. Moreover, it is also provided with a judging process of judging whether or not the determined offset amount is within tolerance with respect to the first offset amount set in advance for offset countermeasures.
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