发明申请
- 专利标题: System and method for testing hardware devices
- 专利标题(中): 用于硬件设备测试的系统和方法
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申请号: US11025576申请日: 2004-12-29
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公开(公告)号: US20060136785A1公开(公告)日: 2006-06-22
- 发明人: San-Yi Shu , De-Hua Dang , Yi-Ching Weng
- 申请人: San-Yi Shu , De-Hua Dang , Yi-Ching Weng
- 申请人地址: TW Tu-Cheng City
- 专利权人: HON HAI Precision Industry CO., LTD.
- 当前专利权人: HON HAI Precision Industry CO., LTD.
- 当前专利权人地址: TW Tu-Cheng City
- 优先权: TW93106640 20041203
- 主分类号: G06F11/00
- IPC分类号: G06F11/00
摘要:
A system for testing hardware devices applies a multi-level architecture including a Graphical User Interface (GUI) level (10), a Dynamic Link Library (DLL) level (20), and a device driving level (30). The GUI level selects test items and test units for a test project based on test requirements, stores the test project in a test script file, configures test parameters for performing the test project, and stores the test parameters in a test parameter configuration file. The DLL level transmits test results of each hardware device (108) to the GUI level. The device driving level includes a device driving module (107) for obtaining test information on the hardware device, comparing the test information with standard information in the test parameter configuration file, and generating a comparison result. A related method is also disclosed.
公开/授权文献
- US07409603B2 System and method for testing hardware devices 公开/授权日:2008-08-05
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