发明申请
- 专利标题: Analyte test sensor and method of manufacturing the same
- 专利标题(中): 分析物测试传感器及其制造方法
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申请号: US11025691申请日: 2004-12-29
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公开(公告)号: US20060144704A1公开(公告)日: 2006-07-06
- 发明人: Alexander Ghesquiere , Simon Tonks
- 申请人: Alexander Ghesquiere , Simon Tonks
- 主分类号: G01N33/487
- IPC分类号: G01N33/487 ; A61B5/05
摘要:
An analyte test sensor for use in measuring the concentration of a particular analyte in a test sample includes a non-conductive substrate, a reference electrode deposited on the substrate, a working electrode deposited on the substrate and a compensation electrode deposited on the substrate. The compensation electrode is provided with a resistive ladder and is designed to correct for test result inaccuracies which are the result of variances in the manufacturing of the test sensor. Specifically, in one embodiment, the compensation electrode corrects for test result inaccuracies in an analog manner by shunting a portion of the working current away from working electrode. In another embodiment, the compensation electrode corrects for test result inaccuracies in a digital manner by providing a calibration code which is proportional its resistance value. A batch of analyte test sensors are preferably manufactured in the following manner. An initial batch of the test sensors is constructed. Then, a limited sampling of the sensors is tested for accuracy using a control sample. Based on the test results, the resistance value of the compensation electrode for each remaining sensor in the batch is adjusted accordingly.
公开/授权文献
- US07418285B2 Analyte test sensor and method of manufacturing the same 公开/授权日:2008-08-26
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