发明申请
US20060150133A1 Integrated circuit (IC) chip design method, program product and system 失效
集成电路(IC)芯片设计方法,程序产品和系统

Integrated circuit (IC) chip design method, program product and system
摘要:
A circuit design method, computer program product and chip design system embodying the method. A gate selected for static timing analysis (STA) from a circuit design. Initial performance characteristics (e.g., load and transition slew) are determined for the selected gate. A charge equivalent effective capacitance (CQeff) is determined for the gate from the initial performance characteristics. A gate delay is determined in a single pass for the gate using CQeff as an effective load for said selected gate. Optionally, if the total gate load capacitance (Ctot) exceeds CQeff by less than a minimum, the effective capacitance (Ceff) is determined and used for determining the gate delay instead.
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