发明申请
- 专利标题: Model based testing for electronic devices
- 专利标题(中): 电子设备基于模型的测试
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申请号: US11098080申请日: 2005-04-04
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公开(公告)号: US20060155411A1公开(公告)日: 2006-07-13
- 发明人: Ajay Khoche , Nicholas Tufillaro , Stanley Jefferson , Lee Barford
- 申请人: Ajay Khoche , Nicholas Tufillaro , Stanley Jefferson , Lee Barford
- 主分类号: G06F19/00
- IPC分类号: G06F19/00
摘要:
The model-based method tests compliance of production devices with the performance specifications of a device design. The production devices are manufactured in accordance with the device design by a manufacturing process. In the method, a simple model form based on the device design and the performance specifications is developed, a stimulus for testing the production devices is specified and each production device is tested. The model form has a basis function and model form parameters for the basis function. The model form parameters are dependent on the manufacturing process and differ in value among the production devices. A production device is tested by measuring the response of the production device to the stimulus; extracting, using the model form, the values of the model form parameters for the production device from the measured response and the stimulus; and checking compliance of the production device with the performance specifications using the extracted values of the model form parameters.
公开/授权文献
- US07457729B2 Model based testing for electronic devices 公开/授权日:2008-11-25
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