- 专利标题: Method and apparatus for testing liquid crystal display device
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申请号: US11391569申请日: 2006-03-29
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公开(公告)号: US20060176072A1公开(公告)日: 2006-08-10
- 发明人: Jong Kim , Hyun Lee , Yong Cho , See Jeong
- 申请人: Jong Kim , Hyun Lee , Yong Cho , See Jeong
- 优先权: KRP2003-28644 20030506
- 主分类号: G01R31/00
- IPC分类号: G01R31/00
摘要:
A method and apparatus for testing a liquid crystal display device are provided to detect a defect location precisely and rapidly without requiring a jig. The method includes providing an inspection apparatus as a removable portion of the liquid crystal display device; inspecting the display part of the liquid crystal display device using the inspection apparatus; removing the inspection apparatus from the liquid crystal display device after the inspection is completed; and attaching driving circuits to the liquid crystal display device having the inspection apparatus removed therefrom.
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