发明申请
US20060176463A1 Lithographic apparatus, device manufacturing method, and device manufactured thereby
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平版印刷设备,器件制造方法和由此制造的器件
- 专利标题: Lithographic apparatus, device manufacturing method, and device manufactured thereby
- 专利标题(中): 平版印刷设备,器件制造方法和由此制造的器件
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申请号: US11345316申请日: 2006-02-02
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公开(公告)号: US20060176463A1公开(公告)日: 2006-08-10
- 发明人: Mark Kroon , Michael Van Beek , Peter Dirksen , Ralph Kurt , Cassandra Owen
- 申请人: Mark Kroon , Michael Van Beek , Peter Dirksen , Ralph Kurt , Cassandra Owen
- 申请人地址: NL Veldhoven
- 专利权人: ASML NETHERLANDS B.V.
- 当前专利权人: ASML NETHERLANDS B.V.
- 当前专利权人地址: NL Veldhoven
- 主分类号: G03B27/72
- IPC分类号: G03B27/72
摘要:
A lithographic apparatus is disclosed. The apparatus includes a radiation system that provides a beam of radiation, and a support structure that supports a patterning structure. The patterning structure is configured to pattern the beam of radiation according to a desired pattern. The apparatus also includes a substrate support that supports a substrate, and a projection system that projects the patterned beam onto a target portion of the substrate. The projection system includes an optical element that has a beam entry area and an optical element that has a beam exit area through each of which the patterned beam passes. The apparatus further includes a nucleated surface that is associated with the projection system on which a plurality of nucleation sites are provided. The surface is disposed away from at least one of the beam entry area and the beam exit area.
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