发明申请
- 专利标题: Stain inspection method and apparatus
- 专利标题(中): 染色检查方法及仪器
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申请号: US11349962申请日: 2006-02-09
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公开(公告)号: US20060193497A1公开(公告)日: 2006-08-31
- 发明人: Ichiro Matsumoto , Tetsuo Nishikawa
- 申请人: Ichiro Matsumoto , Tetsuo Nishikawa
- 申请人地址: JP Minami-Ashigara-shi
- 专利权人: Fuji Photo Film Co., Ltd.
- 当前专利权人: Fuji Photo Film Co., Ltd.
- 当前专利权人地址: JP Minami-Ashigara-shi
- 优先权: JP2005-041112 20050217
- 主分类号: G06K9/00
- IPC分类号: G06K9/00
摘要:
(A) Luminance data is prepared. (B) A group of first order differential values is obtained from luminance values of said luminance data along a first direction, a group of second order differential values is obtained from the group of first order differential values, and first data is output in accordance with the group of second order differential values. There is provided a stain inspection method having high inspection correctness.
公开/授权文献
- US07668344B2 Stain inspection method and apparatus 公开/授权日:2010-02-23
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