发明申请
- 专利标题: Substrate aligning system
- 专利标题(中): 基板对准系统
-
申请号: US11438225申请日: 2006-05-23
-
公开(公告)号: US20060208749A1公开(公告)日: 2006-09-21
- 发明人: Tetsunori Otaguro , Seiji Matsuda
- 申请人: Tetsunori Otaguro , Seiji Matsuda
- 申请人地址: JP Tokyo
- 专利权人: HIRATA CORPORATION
- 当前专利权人: HIRATA CORPORATION
- 当前专利权人地址: JP Tokyo
- 优先权: WOPCT/JP03/15541 20031204
- 主分类号: G01R31/02
- IPC分类号: G01R31/02
摘要:
The present invention provides a substrate aligning system which prevents particles or the like from attaching to a substrate such as a wafer used in the semiconductor manufacturing process, and adjusts the orientation of the substrate accurately within a short period of time. According to a substrate aligning system (A) as a preferred embodiment of the present invention, a plurality of rollers (220) push the peripheral portion of a wafer (W) from different directions to align the center of the wafer. While the center of the wafer is kept aligned by the rollers (220), the contacting portion (211) of an contacting member (210) contacts a chip (Wa) of the wafer (W). The contacting member (210) is then moved arcuately to rotate the wafer (W), thus adjusting the orientation of the wafer.
公开/授权文献
- US07242204B2 Substrate aligning system 公开/授权日:2007-07-10
信息查询