发明申请
US20060208767A1 Switch control apparatus, semiconductor device test apparatus and sequence pattern generating program 有权
开关控制装置,半导体装置测试装置和序列模式生成程序

Switch control apparatus, semiconductor device test apparatus and sequence pattern generating program
摘要:
It is an object to properly control timing of opening and closing a switch by a circuit of simple constitution. A switch control apparatus for controlling a switch is provided, the switch control apparatus including a sequence memory for recording a sequence pattern includes open/close instruction data which instruct to open/close the switch thereon; an address control module for sequentially retrieving each of the open/close instruction data of the sequence pattern from the sequence memory; and an open/close state storage module for storing an open/close state instructed by changed open/close instruction data when the open/close instruction data retrieved by the address control module is changed, wherein the switch opens or closes in response to the open/close state stored by the open/close state storage module.
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