Invention Application
- Patent Title: Embedded IC test circuits and methods
- Patent Title (中): 嵌入式IC测试电路及方法
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Application No.: US11088933Application Date: 2005-03-24
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Publication No.: US20060217085A1Publication Date: 2006-09-28
- Inventor: William Eisenstadt , Robert Fox , Jang Yoon , Tao Zhang
- Applicant: William Eisenstadt , Robert Fox , Jang Yoon , Tao Zhang
- Applicant Address: US FL GAINESVILLE
- Assignee: UNIVERSITY OF FLORIDA RESEARCH FOUNDATION, INC.
- Current Assignee: UNIVERSITY OF FLORIDA RESEARCH FOUNDATION, INC.
- Current Assignee Address: US FL GAINESVILLE
- Main IPC: H01Q11/12
- IPC: H01Q11/12

Abstract:
A self-testing transceiver having an on-chip power detection capability is provided. The self-testing transceiver can include a semiconductor substrate and a transmitter having a high-power amplifier disposed on the substrate. The self-testing transceiver also can include a receiver disposed on the substrate for selectively coupling to an antenna. The self-testing transceiver can further include at least one power detector disposed on the semiconductor substrate for determining a power such as an RMS and/or peak-power of a signal at an internal node of the self-testing transceiver. Additionally, the self-testing transceiver can include a loopback circuit disposed on the substrate.
Public/Granted literature
- US07379716B2 Embedded IC test circuits and methods Public/Granted day:2008-05-27
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