发明申请
- 专利标题: ELECTRONIC-COMPONENT ALIGNMENT METHOD AND APPARATUS THEREFOR
- 专利标题(中): 电子元件对准方法及其设备
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申请号: US11420245申请日: 2006-05-25
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公开(公告)号: US20060218781A1公开(公告)日: 2006-10-05
- 发明人: Atsushi NAKAMURA , Norio KAWATANI , Masahisa HOSOI , Kazumasa OSONIWA , Hiroshi TOKUNAGA
- 申请人: Atsushi NAKAMURA , Norio KAWATANI , Masahisa HOSOI , Kazumasa OSONIWA , Hiroshi TOKUNAGA
- 优先权: JP2002-285992 20020930; JP2002-290369 20021002
- 主分类号: H05K3/30
- IPC分类号: H05K3/30
摘要:
Two electronic components can be accurately aligned with each other such that a mark-recognition apparatus captures mutually corresponding alignment marking-means of the two components in the same fields of view thereof and measures the positions of the two components. A first electronic component having two alignment holes perforated at predetermined positions thereof so as to be spaced away from each other by a predetermined interval is held with a receiving table, and also a second electronic component having two alignment marks formed at predetermined positions thereon so as to have an interval therebetween in agreement with that between the two alignment holes is held with a position-adjusting mechanism. Thus, in a state in which the alignment marks of the second electronic component are introduced in the corresponding alignment holes of the first electronic component, the mark-recognition apparatus captures the alignment marks and the alignment holes in the same fields of view thereof and measures the positions of the two components, and the position-adjusting mechanism adjusts the position of the second electronic component such that the alignment marks of the second electronic component lie at predetermined positions in the alignment holes of the first electronic component.
公开/授权文献
- US07594319B2 Electronic-component alignment method 公开/授权日:2009-09-29