发明申请
- 专利标题: Substrate for electro-optical device, testing method thereof, electro-optical device and electronic apparatus
- 专利标题(中): 电光装置用基板,其测试方法,电光装置及电子设备
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申请号: US11295432申请日: 2005-12-07
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公开(公告)号: US20060226872A1公开(公告)日: 2006-10-12
- 发明人: Tatsuya Ishii
- 申请人: Tatsuya Ishii
- 申请人地址: JP Tokyo
- 专利权人: SEIKO EPSON CORPORATION
- 当前专利权人: SEIKO EPSON CORPORATION
- 当前专利权人地址: JP Tokyo
- 优先权: JP2004-368865 20041221; JP2005-134989 20050506
- 主分类号: H03K19/0175
- IPC分类号: H03K19/0175
摘要:
A substrate for an electro-optical device includes a plurality of scanning lines; a plurality of signal lines that are provided so as to cross the plurality of corresponding scanning lines; a plurality of pixel electrodes that are disposed in a matrix so as to correspond to intersections of the plurality of scanning lines and the plurality of signal lines; a plurality of amplifiers each of which has a first node and a second node, the first node being electrically connected to the corresponding signal line and being input with a first potential signal supplied to the pixel electrode, the second node being input with a second potential signal serving as a reference potential, each amplifier outputting signals such that by comparing a potential of the first potential signal with a potential of the second potential signal, the potential of the first node is further decreased when the first potential signal is low, and the potential of the first node is further increased when the first potential signal is high, each amplifier being provided such that a predetermined number of signal lines of the plurality of signal lines correspond to at least one of the first and second nodes; a selection unit that selects one signal line of the predetermined number of signal lines; and a connection unit that electrically connect the selected signal line to at least one of the first and second nodes of the amplifier.
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