发明申请
- 专利标题: X-ray image diagnostic apparatus
- 专利标题(中): X射线图像诊断装置
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申请号: US10553874申请日: 2004-04-23
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公开(公告)号: US20060227935A1公开(公告)日: 2006-10-12
- 发明人: Shigeyuki Ikeda , Shuji Sugeno , Tadashi Nakamura
- 申请人: Shigeyuki Ikeda , Shuji Sugeno , Tadashi Nakamura
- 优先权: JP2003-117810 20030423
- 国际申请: PCT/JP04/05872 WO 20040423
- 主分类号: H05G1/64
- IPC分类号: H05G1/64
摘要:
An X-ray image diagnostic apparatus including an X-ray source, an X-ray flat panel detector, an image processor, and an image display. The image processor includes a storage for storing plural sets of residual image data, acquired in advance from X-ray images in X-ray image acquisition modes from the X-ray flat panel detector before an actual measurement, in correspondence with the X-ray image acquisition modes, and a residual image corrector for correcting residual image data contained in an X-ray image in the actual measurement from the X-ray flat panel detector, using the residual image data stored in the storage.
公开/授权文献
- US07295652B2 X-ray image diagnostic apparatus 公开/授权日:2007-11-13
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