发明申请
US20060239101A1 Fuse detection method and semiconductor memory device including fuse detection circuit
有权
保险丝检测方法和包含熔丝检测电路的半导体存储器件
- 专利标题： Fuse detection method and semiconductor memory device including fuse detection circuit
- 专利标题（中）： 保险丝检测方法和包含熔丝检测电路的半导体存储器件
-
申请号： US11397689申请日： 2006-04-05
-
公开(公告)号： US20060239101A1公开(公告)日： 2006-10-26
- 发明人: Hajime Tanaka , Yosuke Kawamata
- 申请人： Hajime Tanaka , Yosuke Kawamata
- 专利权人： ELPIDA MEMORY, INC
- 当前专利权人： ELPIDA MEMORY, INC
- 优先权： JP2005-110936 20050407
- 主分类号： G11C17/18
- IPC分类号： G11C17/18
摘要：
A fuse detection method according to the present invention includes reading out a program state of each fuse and generating a killer signal indicating the program state of the fuse; counting the program state indicated by the killer signal to obtain a count value; inputting an expected value for the program state of the fuse; and determining whether the count value coincides with the expected value by comparing the count value with the expected value.