发明申请
- 专利标题： Method and apparatus for generating components for pattern-based system design analysis using a characteristics model
- 专利标题（中）： 使用特征模型生成基于模式的系统设计分析的组件的方法和装置
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申请号： US11133717申请日： 2005-05-20
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公开(公告)号： US20060265346A1公开(公告)日： 2006-11-23
- 发明人: Syed Ali , Yury Kamen , Deepak Alur , John Crupi , Daniel Malks
- 申请人： Syed Ali , Yury Kamen , Deepak Alur , John Crupi , Daniel Malks
- 申请人地址： US CA Santa Clara
- 专利权人： Sun Microsystems, Inc.
- 当前专利权人： Sun Microsystems, Inc.
- 当前专利权人地址： US CA Santa Clara
- 主分类号： G06F17/30
- IPC分类号： G06F17/30
摘要：
A method for analyzing a target system that includes obtaining a characteristics model, generating at least one selected from the group consisting of a schema, characteristics store API, and a characteristics extractor, using the characteristics model, obtaining a plurality of characteristics from the target system using characteristics extractor, wherein each of the plurality of characteristics is associated with the characteristics model, storing each of the plurality of characteristics in the characteristics store using the schema, and analyzing the target system by issuing at least one query to the characteristics store to obtain an analysis result.