发明申请
- 专利标题： Method and apparatus for tracking changes in a system
- 专利标题（中）： 跟踪系统变化的方法和装置
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申请号： US11133831申请日： 2005-05-20
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公开(公告)号： US20060265698A1公开(公告)日： 2006-11-23
- 发明人: Yury Kamen , Syed Ali , Deepak Alur , John Crupi , Daniel Malks
- 申请人： Yury Kamen , Syed Ali , Deepak Alur , John Crupi , Daniel Malks
- 申请人地址： US CA Santa Clara
- 专利权人： Sun Microsystems, Inc.
- 当前专利权人： Sun Microsystems, Inc.
- 当前专利权人地址： US CA Santa Clara
- 主分类号： G06F9/45
- IPC分类号： G06F9/45
摘要：
A method for analyzing a target system that includes obtaining a plurality of characteristics from the target system using a characteristics extractor, wherein the plurality of characteristics is associated with a characteristics model, storing each of the plurality of characteristics in a characteristics store using a tracking mechanism, and analyzing the target system by issuing a query to the characteristics store to obtain an analysis result, wherein the query uses tracking information associated with the tracking mechanism.
公开/授权文献
- US07703074B2 Method and apparatus for tracking changes in a system 公开/授权日：2010-04-20