发明申请
- 专利标题: Automatic array quality analysis
- 专利标题(中): 自动阵列质量分析
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申请号: US11148626申请日: 2005-06-09
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公开(公告)号: US20060282221A1公开(公告)日: 2006-12-14
- 发明人: Manish Shah , James Gruneisen , Luc Vincent
- 申请人: Manish Shah , James Gruneisen , Luc Vincent
- 主分类号: G06F19/00
- IPC分类号: G06F19/00 ; G06K9/00
摘要:
Systems, methods and computer readable media for automatically inspecting a chemical array. At least one processor is adapted to receive a digitized image of the chemical array, and at least one of hardware, software and firmware are adapted to quantify at least one visual characteristic of a feature on the chemical array that contributes to uniformity of the visualization of the feature. Systems, methods and computer readable media are provided for automatically quantifying a visual characteristic of a chemical array. A digitized image of a chemical array having at least one feature is received, and at least one visual characteristic of a feature on the chemical array that contributes to uniformity of the visualization of the feature automatically quantified. A result based on the automatically quantification processing may be outputted to quantify at least one visual characteristic of a feature.
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