发明申请
- 专利标题: Method for measuring dead time of X-ray detector
- 专利标题(中): 测量X射线探测器死区时间的方法
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申请号: US11435237申请日: 2006-05-16
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公开(公告)号: US20060285642A1公开(公告)日: 2006-12-21
- 发明人: Tomoyasu Ueda , Yoshiyasu Ito , Kazuhiko Omote
- 申请人: Tomoyasu Ueda , Yoshiyasu Ito , Kazuhiko Omote
- 申请人地址: JP Tokyo
- 专利权人: Rigaku Corporation
- 当前专利权人: Rigaku Corporation
- 当前专利权人地址: JP Tokyo
- 优先权: JP2005-148039 20050520
- 主分类号: H05G1/38
- IPC分类号: H05G1/38
摘要:
The dead time of a pulse type X-ray detector is measured without estimation of a true X-ray intensity. The first and the second conditions are used for varying an intensity of an X-ray entering the X-ray detector. The first condition may be the slit width of a receiving slit, at least three kinds of slit width being selected. The second condition may be with or without an absorption plate. The first observed X-ray intensities are observed, with the absorption plate inserted, for three or more values in slit width. Next, the second observed X-ray intensities are observed similarly but with the absorption plate removed. A predetermined relational expression is made up among the first observed X-ray intensity, the second observed X-ray intensity, a ratio k of the second observed X-ray intensity to the first observed X-ray intensity (depending upon attenuation in X-ray intensity caused by the absorption plate) and the dead time τ of the X-ray detector. Based on the relational expression, a fitting operation is carried out with the least squares method so as to determine the dead time τ precisely.
公开/授权文献
- US07342997B2 Method for measuring dead time of X-ray detector 公开/授权日:2008-03-11
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