发明申请
US20070004323A1 Polishing composition and polishing method 审中-公开
抛光组合物和抛光方法

  • 专利标题: Polishing composition and polishing method
  • 专利标题(中): 抛光组合物和抛光方法
  • 申请号: US11516131
    申请日: 2006-09-06
  • 公开(公告)号: US20070004323A1
    公开(公告)日: 2007-01-04
  • 发明人: Keigo OhashiToshiki Owaki
  • 申请人: Keigo OhashiToshiki Owaki
  • 优先权: JP2003-374664 20031104
  • 主分类号: B24D3/02
  • IPC分类号: B24D3/02 B24B1/00
Polishing composition and polishing method
摘要:
A polishing composition of the present invention contains silicon dioxide, an acid, and water. Silicon dioxide is, for example, colloidal silica, fumed silica, or precipitated silica. The acid is, for example, hydrochloric acid, phosphoric acid, sulfuric acid, phosphonic acid, nitric acid, phosphinic acid, boric acid, acetic acid, itaconic acid, succinic acid, tartaric acid, citric acid, maleic acid, glycolic acid, malonic acid, methanesulfonic acid, formic acid, malic acid, gluconic acid, alanine, glycin, lactic acid, hydroxyethylidene diphosphonic acid, nitrilotris(methylene phosphonic acid), or phosphonobutane tricarboxylic acid. The pH of the polishing composition is preferably in the range of 0.5 to 6. The polishing composition can be suitably used in applications for polishing a glass substrate.
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