发明申请
US20070018003A1 Abnormal condition detection circuit, integrated circuit card having the circuit, and method of operating CPU 有权
异常状态检测电路,具有该电路的集成电路卡,以及CPU的操作方法

  • 专利标题: Abnormal condition detection circuit, integrated circuit card having the circuit, and method of operating CPU
  • 专利标题(中): 异常状态检测电路,具有该电路的集成电路卡,以及CPU的操作方法
  • 申请号: US11341176
    申请日: 2006-01-27
  • 公开(公告)号: US20070018003A1
    公开(公告)日: 2007-01-25
  • 发明人: Ji-Hoon Jeong
  • 申请人: Ji-Hoon Jeong
  • 专利权人: Samsung Electronics Co., Ltd.
  • 当前专利权人: Samsung Electronics Co., Ltd.
  • 优先权: KR10-2005-0065168 20050719
  • 主分类号: G06K19/06
  • IPC分类号: G06K19/06
Abnormal condition detection circuit, integrated circuit card having the circuit, and method of operating CPU
摘要:
An abnormal condition detection circuit, an integrated circuit (IC) card having a central processing unit (CPU), and a method of operating the CPU, allow the CPU to be reset when an abnormal condition is detected in the IC card. The IC card includes the CPU, a non-volatile memory, an abnormal condition detection circuit, and a reset signal generator. The IC card includes detectors that detect a corresponding abnormal condition in the IC card, and an enable signal generation circuit that generates a reset enable signal and an interrupt enable signal in response to an interrupt control signal and a detection signal output from at least one of the detectors. The reset signal generator generates a reset signal in response to the reset enable signal. The CPU is reset in response to the reset signal and interrupted in response to the interrupt enable signal.
信息查询
0/0