发明申请
US20070018003A1 Abnormal condition detection circuit, integrated circuit card having the circuit, and method of operating CPU
有权
异常状态检测电路,具有该电路的集成电路卡,以及CPU的操作方法
- 专利标题: Abnormal condition detection circuit, integrated circuit card having the circuit, and method of operating CPU
- 专利标题(中): 异常状态检测电路,具有该电路的集成电路卡,以及CPU的操作方法
-
申请号: US11341176申请日: 2006-01-27
-
公开(公告)号: US20070018003A1公开(公告)日: 2007-01-25
- 发明人: Ji-Hoon Jeong
- 申请人: Ji-Hoon Jeong
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 优先权: KR10-2005-0065168 20050719
- 主分类号: G06K19/06
- IPC分类号: G06K19/06
摘要:
An abnormal condition detection circuit, an integrated circuit (IC) card having a central processing unit (CPU), and a method of operating the CPU, allow the CPU to be reset when an abnormal condition is detected in the IC card. The IC card includes the CPU, a non-volatile memory, an abnormal condition detection circuit, and a reset signal generator. The IC card includes detectors that detect a corresponding abnormal condition in the IC card, and an enable signal generation circuit that generates a reset enable signal and an interrupt enable signal in response to an interrupt control signal and a detection signal output from at least one of the detectors. The reset signal generator generates a reset signal in response to the reset enable signal. The CPU is reset in response to the reset signal and interrupted in response to the interrupt enable signal.
公开/授权文献
信息查询