发明申请
US20070021848A1 Testing system and related method for testing an electronic device by determining a power on/off signal 审中-公开
通过确定电源开/关信号来测试电子设备的测试系统和相关方法

  • 专利标题: Testing system and related method for testing an electronic device by determining a power on/off signal
  • 专利标题(中): 通过确定电源开/关信号来测试电子设备的测试系统和相关方法
  • 申请号: US11363674
    申请日: 2006-02-27
  • 公开(公告)号: US20070021848A1
    公开(公告)日: 2007-01-25
  • 发明人: Chih-Wei Huang
  • 申请人: Chih-Wei Huang
  • 申请人地址: TW Taipei
  • 专利权人: Inventec Corporation
  • 当前专利权人: Inventec Corporation
  • 当前专利权人地址: TW Taipei
  • 优先权: TW094124643 20050721
  • 主分类号: G05B11/01
  • IPC分类号: G05B11/01
Testing system and related method for testing an electronic device by determining a power on/off signal
摘要:
A testing method and related system enables a power management device to power-on or power-off a second electrical device via a first transmission interface of a first electrical device. The first electrical device sets power-on and power off times of the power management device. The first electrical device sends a power-on or a power-off control instruction to the power management device via the first transmission interface based on the set power-on and power-off times to power-on or power-off the power management device, and the first electrical device performs a timing process. The second electrical device executes a corresponding power-on or power-off process based on power statuses of the power management device. The first electrical device determines whether the second electrical device returns with a power-on or a power-off testing signal as a testing result within a predetermined time during the process of timing.
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