Invention Application
US20070023631A1 Parallel sample handling for high-throughput mass spectrometric analysis
审中-公开
用于高通量质谱分析的并行样品处理
- Patent Title: Parallel sample handling for high-throughput mass spectrometric analysis
- Patent Title (中): 用于高通量质谱分析的并行样品处理
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Application No.: US11092104Application Date: 2005-03-29
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Publication No.: US20070023631A1Publication Date: 2007-02-01
- Inventor: Zoltan Takats , Robert Cooks
- Applicant: Zoltan Takats , Robert Cooks
- Main IPC: H01J49/00
- IPC: H01J49/00
Abstract:
A system to handle a set of samples for mass spectrometric analysis includes a set of elements that couples to a sample plate containing the set of samples. Each element is integrated with a respective mass analyzer, and includes an ionizer to ionize the respective sample. The set of samples are collected and then ionized simultaneously, and the ionized samples are transferred simultaneously to the respective mass analyzers.
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