发明申请
US20070024962A1 METHOD FOR THE DETERMINATION OF CONFIGURATION-DEPENDENT AND STATE-DEPENDENT MICROSCOPE PARAMETERS
审中-公开
用于确定依赖于配置和状态相关微参数参数的方法
- 专利标题: METHOD FOR THE DETERMINATION OF CONFIGURATION-DEPENDENT AND STATE-DEPENDENT MICROSCOPE PARAMETERS
- 专利标题(中): 用于确定依赖于配置和状态相关微参数参数的方法
-
申请号: US11457194申请日: 2006-07-13
-
公开(公告)号: US20070024962A1公开(公告)日: 2007-02-01
- 发明人: STEFAN STEINBORN , Steffen Leidenbach
- 申请人: STEFAN STEINBORN , Steffen Leidenbach
- 专利权人: Carl Zeiss Jena GmbH
- 当前专利权人: Carl Zeiss Jena GmbH
- 优先权: DE102005036143.9 20050727
- 主分类号: G02B21/00
- IPC分类号: G02B21/00
摘要:
In a method for determining configuration-dependent and state-dependent microscope parameters which are influenced by a plurality of microscope components that are arranged in the optical path of a microscope, it is the object of the invention to design the quantification method for the microscope parameters in a universally usable manner, i.e., so as to be applicable in an improved manner for microscopes of different constructions. After preparing a microscope-specific tree structure of the optical paths which proceeds from an object to be observed and extends from the start of the illumination beam paths to the end of the observation beam paths, the positions of the microscope components in the tree structure and components preceding and succeeding each of the microscope components are determined. Proceeding from a starting point in the tree structure, the degree of influence exerted on the microscope parameter to be determined is determined recursively along a chain of preceding components or succeeding components as a partial contribution for each microscope component exerting an influence in order to determine from the partial contributions the total influence exerted on the microscope parameter by the microscope components.
信息查询