发明申请
US20070025152A1 Nonvolatile semiconductor memory device and a method for programming nand type flash memory 有权
非易失性半导体存储器件和用于编程nand型闪速存储器的方法

  • 专利标题: Nonvolatile semiconductor memory device and a method for programming nand type flash memory
  • 专利标题(中): 非易失性半导体存储器件和用于编程nand型闪速存储器的方法
  • 申请号: US11495463
    申请日: 2006-07-31
  • 公开(公告)号: US20070025152A1
    公开(公告)日: 2007-02-01
  • 发明人: Takuya Futatsuyama
  • 申请人: Takuya Futatsuyama
  • 申请人地址: JP Minato-ku
  • 专利权人: Kabushiki Kaisha Toshiba
  • 当前专利权人: Kabushiki Kaisha Toshiba
  • 当前专利权人地址: JP Minato-ku
  • 优先权: JP2005-222698 20050801
  • 主分类号: G11C11/34
  • IPC分类号: G11C11/34
Nonvolatile semiconductor memory device and a method for programming nand type flash memory
摘要:
A non-volatile semiconductor memory device comprise a memory cell array having a plurality of memory cell units each having a plurality of electrically-programmable memory cell connected in series, a plurality of word lines each connected to each of control gates of said plurality of memory cells, said plurality of word lines including a selected word line connected to a control gate of selected one of said memory cells for programming, and a plurality of unselected word lines different from said selected word line, a bit line connected to one end of said memory cell unit, and a source line connected to another end of the memory cell unit, wherein, when data is programmed into the selected memory cells, a first potential is supplied to said selected word line, and a first unselected word line adjacent, toward a source line side, to said selected word line is set to floating state, and thereafter, a second potential which is higher than said first potential is supplied to said selected word line.
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