发明申请
- 专利标题: Phase change material, phase change random access memory including the same, and methods of manufacturing and operating the same
- 专利标题(中): 相变材料,包括相变的相变随机存取存储器及其制造和操作的方法
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申请号: US11498796申请日: 2006-08-04
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公开(公告)号: US20070029606A1公开(公告)日: 2007-02-08
- 发明人: Jin-seo Noh , Yoon-ho Khang , Sang-mock Lee , Dong-seok Suh
- 申请人: Jin-seo Noh , Yoon-ho Khang , Sang-mock Lee , Dong-seok Suh
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 优先权: KR10-2005-0071482 20050804
- 主分类号: H01L29/788
- IPC分类号: H01L29/788
摘要:
A phase change material, a PRAM including the same, and methods of manufacturing and operating the same are provided. Insulating impurities may be uniformly distributed over an entire or partial region of the phase change material. The PRAM may include a phase change layer including the phase change material. The insulating impurity content of the phase change material may be 0.1 to 10% (inclusive) the volume of the phase change material. The insulating impurity content of the phase change material may be adjusted by controlling the power applied to a target including the insulating impurities.
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