发明申请
US20070029989A1 Error factor acquisition device, method, program, and recording medium
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误差因子采集装置，方法，程序和记录介质
- 专利标题： Error factor acquisition device, method, program, and recording medium
- 专利标题（中）： 误差因子采集装置，方法，程序和记录介质
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申请号： US10572381申请日： 2004-09-14
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公开(公告)号： US20070029989A1公开(公告)日： 2007-02-08
- 发明人: Masato Haruta , Hiroyuki Sato , Takeshi Tanabe , Yoshikazu Nakayama
- 申请人： Masato Haruta , Hiroyuki Sato , Takeshi Tanabe , Yoshikazu Nakayama
- 申请人地址： JP Tokyo
- 专利权人： ADVANTEST CORPORATION
- 当前专利权人： ADVANTEST CORPORATION
- 当前专利权人地址： JP Tokyo
- 优先权： JP2003-325793 20030918
- 国际申请： PCT/JP04/13713 WO 20040914
- 主分类号： G01R23/16
- IPC分类号： G01R23/16
摘要：
It is possible to calibrate a measurement system for circuit parameters of a DUT (device under test) by reducing the number of attachments and detachments of calibration kits. An error factor acquisition device includes: a first calibrator (100) connected to ports (18, 28) of a network analyzer and having a first state realization unit (120) for realizing open-circuit, short-circuit, and standard load states for the ports (18, 28) or short-circuiting the ports (18, 28); and second calibrators (200) connected to the first calibrator (100) and the DUT (400) and respectively having a second state realization unit (220) for realizing open-circuit, short-circuit, and standard load states for the ports (18, 28). The first calibrator (100) includes first connection units (110a, 110b) for connecting the ports (18, 28) to the first state realization unit (120) or to the respective second calibrators (200) while the second calibrators (200) respectively include a second connection unit (210) for connecting the ports (18, 28) to the second state realization unit (220) or to the DUT (400).
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